Atomic-scale characterization of few-layer Cr 5 Se 8Paul Dreher,Wen Wan,Max Ilyn,Javier Herrero-Martín,Pierluigi Gargiani,Marco Gobbi,Santiago Blanco-Canosa,Miguel M. UgedaBulletin of the American Physical Society(2021)引用 0|浏览3暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要