Single-Event Transient Case Study for System-Level Radiation Effects Analysis
IEEE Transactions on Nuclear Science(2021)
摘要
Analog single-event transient (SET) results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation (GSN).
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关键词
Radiation,single-event effects (SEEs),single-event transients (SETs),system-level effects
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