宽带功率放大器温度可靠性研究
Journal of Tianjin University of Technology(2017)
Abstract
本文通过一系列的实验对宽带放大器的温度可靠性进行了测试和分析.旨在通过环境温度测试及温度突变测试来研究温度对功率放大器直流特性、S参数、RF输出特性和可靠性的影响.实验结果表明,环境温度的升高和突变会引起功率放大器性能发生显著退化.这对射频设备的可靠性研究和设计提供重要的指导.
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Key words
broadband power amplifier,temperature reliability,thermal shock,GaN HEMT,performance degradation
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