Si衬底GaN基蓝光LED老化性能
CHINESE JOURNAL OF LUMINESCENCE(2010)
Abstract
报道了芯片尺寸为500 μm ×500μm硅衬底GaN基蓝光LED在常温下经1 000 h加速老化后的电学和发光性能,其光功率随老化时间的变化分先升后降两个阶段;老化后的反向漏电流和正向小电压下的电流均有明显的增加;老化后器件的外量子效率(EQE)比老化前低;老化前后EQE衰减幅度在不同的注入电流下存在明显差异,衰减幅度最小处出现在发光效率最高时对应的电流密度区间.
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Key words
led,gan-based
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