Chrome Extension
WeChat Mini Program
Use on ChatGLM
VIPCreated with Sketch.

高速InGaAs光电探测器可靠性寿命评估

吴琼瑶,李晓潮,伍明娟,李钦,刘吉

China Inspection Body&Laboratory（2020）

Cited 0|Views6
No score
Abstract
随着航天应用高速InGaAs探测器的迅速发展,其可靠性问题日益突出,本文选择温度应力与光应力为加速应力,通过爱林模型与恒定应力加速寿命试验方法对XX型高速InGaAs探测器进行了研究,获得了InGaAs探测器在4种组合应力下的退化数据与寿命模型,进而推算出器件在正常工作状态下的寿命.
More
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined