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中子照相定量分析能谱影响校正

Jun QIN,Yang DU,Ben-jiang MAO,Yong-gang YUAN,Wen-jie LI

Nuclear Electronics & Detection Technology（2017）

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Abstract
提出了有效截面刻度曲线法用于中子照相定量分析中能谱影响校正,该方法操作简单、可行性强.利用该方法对蒙特卡罗计算所得中子图像进行分析及中子能谱影响校正,取得了较好的效果.
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