一种高速、高共模噪声抗扰的电平位移电路

Electronics and Packaging(2019)

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Abstract
介绍了一种应用于GaN驱动的0.35 μm HV CMOS工艺的高速、高共模噪声抗扰的电平位移电路.该电路采用高速电流镜和双锁存结构,并增加共模抗扰辅助电路,大大提高了传输速度和对共模噪声的抗扰能力.该高速、高共模噪声抗扰的电平位移电路主要用于驱动增强型GaN的高压半桥栅驱动.仿真结果显示该电平位移电路上升沿传输延时1.03 ns,下降沿传输延时1.15 ns,可承受GaN高压半桥栅驱动开关节点SW处电压浮动50 V/ns.
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