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Investigation on Ultra-low Turn-off Losses Phenomenon for SiC MOSFETs with Improved Switching Model

IEEE Transactions on Power Electronics(2021)

引用 23|浏览8
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摘要
Traditional SiC MOSFET switching models cannot predict the turn-off losses precisely in the condition of small driver resistance and small load current, because they have not considered a special case in which the SiC MOSFET closes its channel before the SiC diode turns into the freewheeling-state during turn-off transient. To solve this problem, this article presents an improved SiC MOSFET turn-o...
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关键词
Silicon carbide,MOSFET,Semiconductor device modeling,Integrated circuit modeling,Capacitance,Mathematical model,Switches
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