Test and Yield Loss Reduction of AI and Deep Learning Accelerators
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems（2022）
摘要
With data-driven analytics becoming mainstream, the global demand for dedicated artificial intelligence (AI) and deep learning accelerator chips is soaring. These accelerators, designed with densely packed processing elements (PE), are especially vulnerable to the manufacturing defects and functional faults common in the advanced semiconductor process nodes resulting in significant yield loss. In ...
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关键词
Circuit faults,AI accelerators,Artificial neural networks,Training,Task analysis,Hardware,Neurons
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