Characterization Of The Interaction Between Graphene And Copper Substrate By Time-Of-Flight Secondary Ion Mass Spectrometry

The interaction between graphene and different metal substrates is important for preparation of graphene with large area and high quality. The existence of graphene-metal interaction can also alter the electronic properties of graphene. In this study, experiments using time-of-flight secondary ion mass spectrometry (ToF-SIMS) were conducted at 450 degrees C to investigate the interaction between graphene and Cu foil substrate. In the ToF-SIMS spectra, in addition to graphene and Cu-related peaks, we also found the peaks originated from the interaction between graphene and Cu foil substrate. The distribution of the graphene-related ions and the ions related to the graphene-Cu interaction shows a similar pattern in the ToF-SIMS images; however, the distribution of the ions related to the graphene and the Cu oxide exhibits a complementary pattern, revealing that a graphene-covered Cu surface shows an improved oxidation resistance during annealing processes and storage. This work provides direct and strong evidence showing the interaction between graphene and Cu foil substrate.