Analysis of the Transverse Force in the Rayleigh and Mie Approximations for a Capture Beam TEM00 and TEM*01
Respuestas(2020)
Abstract
Optical tweezers use a highly-focused laser beam to capture and manipulate micro- and nanometric objects. These have been demonstrated to be a promising devices for state-of-the-art research in several fields, such as microbiology and biophysics. The prediction of the optical forces that are present in this phenomenon is a current problem in continuous evolution. Additionally, the recent use of vortex beams with exotic properties as the orbital angular momentum, with advantages as the rotational manipulation of the captured microparticles and reduction of the optical damage in biological samples (Opticution), makes the problem even more complex. Mathematical expressions in the Rayleigh and Mie regimes for the radiation force on a dielectric sphere captured by TEM00 and TEM*01 mode beams are presented. Theoretical results are then compared with experimental measurements obtained with a direct force measurement device based on light-momentum detection.
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Key words
capture beam tem00,transverse force,mie approximations
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