Study on the Hardening of Single-Event Transient in D-type Flip-Flop Based on InP HBT
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)（2020）
关键词
D-type flip-flop (D-FF),InP,heterojunction bipolar transistor (HBT),single-event transient (SET),hardened circuit
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要