A Device Design for 5 nm Logic FinFET Technology

2020 China Semiconductor Technology International Conference (CSTIC)(2020)

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摘要
In this paper, we proposed a 5 nm FINFET device, which is based on typical 5 nm logic design rules. We have performed an optimization on the process parameters and iterate through device simulation with the consideration of current process capability. Based on our preferred device architecture, we provide our process key dimensions, and simulated device DC/AC performance, and some parasitic parameters. As a part of the final evaluation, Ring Oscillator (RO) simulation result has been checked, which demonstrates that the Performance Per Area (PPA) is close to industry reference 5 nm performance.
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关键词
parasitic parameters,Performance Per Area,device design,logic FinFET technology,5 nm FINFET device,logic design rules,device simulation,current process capability,preferred device architecture,industry reference performance,device DC-AC performance,ring oscillator,size 5.0 nm
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