LIFETIMES OF THE O-2(+) CONFIGURATION IN HG-186 AND HG-188
INSTITUTE OF PHYSICS CONFERENCE SERIES(1993)
摘要
A new picosecond lifetime measurement system developed at UNISOR was used to determine the Lifetime of the well-deformed O-2(+) levels in Hg-188 and Hg-186. The half-life values were measured to be 288 +/- 63 ps in Hg-188 and less than or equal to 52 ps in Hg-186. The corresponding values of rho(2)(EO) x 10(3) obtained from the EO partial half-lives are 5.5+/-(1.5)(2.3) and greater than or equal to 32, respectively. Additionally, the half-lives of the 2(2)(+) levels were determined to be 199 +/- 44 ps in Hg-188 and 66 +/- 37 ps in Hg-186.
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