Cold CMOS As a Power-Performance-Reliability Booster for Advanced FinFETs
2020 IEEE Symposium on VLSI Technology（2020）
关键词
cold CMOS performance,lower wire resistance,reduction method,net power reduction,refrigeration power,energy reduction,global signal propagation,SRAM,logic switching speed,advanced FinFET,power-performance-reliability booster,temperature 77.0 K,Cu
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