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Measurement of decay properties for r-process models

Neerajan Nepal,A. Algora,A. Estrade,S. Nishimura, J. Argamunt,R. Caballero-Folch,F. Calvino,T. Davinson,I. Dillmann, R. Grywacz,G. Kiss, J. Liu,G. Lorusso,V. Phong,B.C. Rasco,K.P. Rykaczewski,J.L. Tain,A. Tarifeno-Saldivia,A. Tolosa-Delgado,P. Woods,R. Yokoyama

Bulletin of the American Physical Society（2020）

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Key words
decay properties,r-process
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