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Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions

IEEE Transactions on Nuclear Science(2020)

Cited 17|Views32
Key words
Field programmable gate arrays,Ions,Radiation effects,Random access memory,Neutrons,Ion beams,Aerospace electronics,Field programmable gate array (FPGA),heavy ion irradiation,single-event effects (SEEs),Zynq-7000 family
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