Phase Transition And Raman Evolution In Pressurized Antiferromagnetism Van Der Waals Topological Insulator

Zhangji Zhao,Chaowei Hu,Abby Kavner,Ni Ni,Chee Wei Wong

2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)（2020）

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摘要

We investigate the antiferromagnetic topological insulator MnBi4Te7 using Raman and powder XRD under high pressure. Raman peaks are red-shifted from 0 to 8.28 GPa. No structural phase transition is observed below 10.4GPa. (c) 2020 The Author(s)

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关键词

structural phase transition,powder X-ray diffraction,Raman spectroscopy,antiferromagnetic van der waals topological insulator,pressurized antiferromagnetism,high pressure effects,red-shift,MnBi4Te7

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