Noise mechanisms of radio-frequency reflectometry in gallium arsenide quantum dots

We investigate electrical readout noise in high-speed rf reflectometry using gallium arsenide quantum dots. The fast Fourier transform spectrum from the real time measurement reflects a build-in device noise and a circuit noise including the resonator and the amplifier. We separate their noise spectral components by model analysis. A flicker noise appears below around 10 kHz and depends on the charge sensor's sensitivity. We point out that rf reflectometry is a powerful tool to probe the device noise, and that the dominant component of the readout noise changes by the measurement integration time.