TEM STUDIES OF BURIED HETEROSTRUCTURE LASER-DIODES BEFORE AND AFTER OVERSTRESS TESTING

U BANGERT, ATR BRIGGS, AR GOODWIN,P CHARSLEY

INSTITUTE OF PHYSICS CONFERENCE SERIES（1991）

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Abstract

Transmission electron microscopy studies have been carried out on degraded buried heterostructure lasers and unaged controls. Degradation was produced by deliberately overstressing the lasers at high currents and high temperatures.

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