Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (vol 52, 034004, 2018)

A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers Jet al 2018 J. Phys. D: Appl. Phys. 52 034004). Due to the recent detection and investigation of an additional third decay regime of the afterglow of an extreme ultraviolet photon-induced plasma described in a later article (Platier Bet al 2020 Appl. Phys. Lett. 116 103703) there is an additional reason for a minimum number of photons for this approach to work. Near or below this threshold, we explain that the response time of the diagnostic method is a limiting factor. Further, a second limit for the number of photons within a pulse is formalized related to the trapping of highly energetic free electrons.