Heavy Ion Radiation Assessment of a 100G/200G Commercial Optical Coherent DSP ASIC

We assess the viability of a state-of-the-art 100G/200G commercial optical coherent DSP ASIC (16 nm FinFET CMOS technology) for space applications through heavy ion testing to (1) screen for destructive SELs and (2) observe for non-destructive heavy ion SEEs on the ASIC. The ASIC was exposed to heavy ion radiation while operating both optically noise-loaded uplink and downlink to an optical "ground" modem. There were no destructive SEEs, such as SELs, observed from the heavy ion radiation test campaign.