Material composition detection using an image segment with an improved artificial bee colony algorithm

In the process of material composition detection, image analysis is an inevitable problem. Multilevel thresholding based on the OTSU method is one of the most popular image segmentation techniques. The increase of the number of thresholds increases with the exponential increase in computing time. In order to overcome this problem, this paper proposes an artificial bee colony algorithm with a two-level topology. This improved artificial bee colony algorithm can quickly find the suitable thresholds without the trap of a local optimum. The test results confirm the good performance.