X-ray Optics Testing Beamline 1-BM at the Advanced Photon Source

AIP Conference Proceedings(2016)

引用 27|浏览37
暂无评分
摘要
Beamline 1-BM at the APS has been reconfigured in part for testing of synchrotron optics with both monochromatic and white beams. Operational since 2013, it was reconfigured to accommodate users of the APS as well as users from other DOE facilities. Energies between 6 and 28 keV are available. The beamline was reconfigured to remove two large mirrors and to provide a 100 mm wide monochromatic beam at 54 m from the source. In addition a custom white beam shutter was implemented for topography exposures as short as 65 millisec over the full available horizontal width. Primary agendas include both white beam and monochromatic beam topography, Talbot grating interferometry, and tests of focusing optics. K-B mirrors, MLLs, and FZPs have been characterized. Measurements of the spatial coherence lengths on the beamline were obtained with Talbot interferometry. Topography data has been reported.
更多
查看译文
关键词
Electron Beam Lithography
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要