A Tutorial Introduction to DCM Quantitative Characterization and Modelling of Material Microstructures Using Monochromatic Multi-Energy X-Ray CT

AIP Conference Proceedings(2016)

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Abstract
This article is intended as a tutorial guide for new users of the DCM (data-constrained modelling) software for quantitative characterization of material 3D microstructures using multi-energy X-ray CT data. It guides users through the steps necessary for processing a small CIPS (Calcite In-situ Precipitation System) sandstone data set. It also covers some built-in and plug-in features to analyze and visualize the microstructures.
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Key words
dcm quantitative characterization,material microstructures,multi-energy,x-ray
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