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Raman mapping of MoS2 at Cu2ZnSnS4/Mo interface in thin film

I.S. Babichuk,M.O. Semenenko,R. Caballero,O.I. Datsenko,S. Golovynskyi,Ran Qiu,Chun Huang,Rui Hu,I.V. Babichuk,R.R. Ziniuk,M. Stetsenko,O.A. Kapush,Jian Yang,Baikui Li,Junle Qu,M. Leon

Solar Energy（2020）

Cited 23|Views18
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Abstract
•High-ordered crystalline CZTS is formed under subatmospheric sulfurization.•The film morphology and structure are investigated at different depths.•Formation of large grains leads to low resistivity of the film.•Distribution of MoS2 inclusions at the CZTS/Mo interface is studied.•Resonance μ-Raman spectroscopy is used including mapping of secondary phases.
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Key words
CZTS,Secondary phase,MoS2,Raman mapping,C-AFM
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