Determination of equivalent transversely isotropic material parameters for sheet-layered lamination stacks

•Accurate transversely isotropic material parameters of bonded lamination stacks.•Material parameter determination ab initio by different homogenization methods.•High material parameter sensitivity to the interlaminar varnish stiffness and thickness.•Varnish thickness measurement by laser scanning microscopy and nanoindentation.•Proving the capability with the help of a numerical and experimental modal analysis.