Dual-wavelength Mach-Zehnder interferometry-assisted photothermal spectroscopy for characterization of surface contaminants.

Photothermal spectroscopy (PTS) working in the mid-infrared region is an effective technique for in-situ characterization of the chemical composition of surface contaminants. The sensitivity relies on the way that the laser-induced response of the sample is detected. We present a highly-sensitive PTS assisted with a dual-wavelength Mach-Zehnder interferometer (MZI), MZI-PST in short. The MZI aims to sense all the phase delays taking place at the sample and air when the heat produced by resonance absorption of the contaminant is transferred into its surroundings and further to amplify the total phase delay to a large intensity difference of a probe beam. To guarantee a stable quadrature phase bias of the MZI working in the balanced detection mode, we employ two separate wavelengths, one for sensing and the other for phase bias feedback, to lock the working point to the quadrature point in real time. The MZI is expected to have a 7.8-fold sensitivity enhancement compared with the conventional phase-sensitive PTS in theory. The results of the proof-of-concept experiment on the olive oil contaminated on a wafer surface verify the spectral fidelity and the sensitivity enhancement as well as the capability of photothermal spectral imaging of the MZI-PST.