The Nano-mechanical Characteristic Experimentation Analysis of Aerial Film Material

Jun Xie,Yingnan Liu, Kai Xie, Wei Han,Zhonglin Xu

Proceedings of the 2016 6th International Conference on Advanced Design and Manufacturing Engineering (ICADME 2016)(2016)

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Abstract
Nano measurement technology is an important means of nano-mechanical properties of thin materials research. Aerial film has more excellent physical and mechanical properties compared to common film. Nano indentation continuous stiffness testing method is applied in the paper, the nano-mechanical properties test of aerial film material analysis is carried out, and the nano-mechanical properties of the material are obtained without emulsion layer and the base material separation, the load-displacement curve was continuous recorded, the calculation values of aerial film material nano-mechanical properties are acquired, and the subsequent research theoretical foundation of the correlation of film image quality and its nano mechanical properties are provided.
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Key words
aerial film,photographic material,nano-mechanical,characteristic analysis
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