On-Demand 3d Printing Of Nanowire Probes For High-Aspect-Ratio Atomic Force Microscopy Imaging

ACS APPLIED MATERIALS & INTERFACES(2020)

引用 8|浏览4
暂无评分
摘要
With the growing importance of three-dimensional (3D) nanomaterials and devices, there has been a great demand for highfidelity, full profile topographic characterizations in a nondestructive manner. A promising route is to employ a high-aspect-ratio (HAR) probe in atomic force microscopy (AFM) imaging. However, the fabrication of HAR-AFM probes continues to suffer from extravagant cost, limited material choice, and complicated manufacturing steps. Here, we report one-step, on-demand electrohydrodynamic 3D printing of metallic HAR-AFM probes with tailored dimensions. Our additive fabrication approach yields a freestanding metallic nanowire with an aspect ratio over 30 directly on a cantilever within tens of seconds, producing a HAR-AFM probe. Furthermore, the benefits associated with unprecedented simplicity in the probe's dimension control, material selection, and regeneration are provided. The 3D-printed HAR-AFM probe exhibits a better fidelity in deep trench AFM imaging than a standard pyramidal probe. We expect this approach to find facile, material-saving manufacturing routes in particular for customizing functional nanoprobes.
更多
查看译文
关键词
high-aspect-ratio probe, atomic force microscope, electrohydrodynamic printing, 3D nanoscale topography, deep trench
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要