The Single Event Upset Forecasting in Digital and Analog Integrated Circuits in SAED 14nm FinFet Technology

This paper presents a forecasting method of the Single Event Upset effect on the performance of analog and digital circuits designed in SAED 14nm FinFet technology. Meanwhile, the EDA tool was suggested which automatically inserts the radiation effect in the SPICE netlist and generates a new netlist for further debugging. The tool can automatically run a SPICE simulation and generate plot files in SPICE output formats. The suggested user-friendly GUI helps the designer to realize the measurements and organize the faster debug.