Radiation-hard camera tests near the SIS 18 extraction

For imaging applications in the high radiation environment of heavy ion synchrotrons radiation-hard cameras are required. One possible candidate for such cameras at FAIR is the CCIR MegaRAD3 from Thermo Fischer Scientific. First measurements with this camera, which has been installed at the SIS18 extraction point, have been performed. Technological advances in solid state camera design provide a wider choice of equipment for beam instrumentation. However, our previous experience with CCD based cameras has shown that their performance degrades during operation due to the background radiation ( γ, neutrons, etc.) produced by the heavy ion beam (see Figure 1 left). Any semiconductor device operating in a radiation field suffers from degradation due to radiation damages. Energetic particles incident on the semiconductor bulk lose their energy due to ionizing and non-ionising processes as they travel through a given material. The ionising processe s involve electron-hole pair production and subsequent energy deposition (dose) effects. The non-ionizing processe s result in displacement damage effects, i.e. defects in the semiconductor lattice like vacancies and interstitials [1 ].