Structural and Optical Properties of Thermally Evaporated CdSe Thin Films

The polycrystalline CdSe thin films were deposited on amorphous glass substrate by the thermal evaporation technique under the pressure of 10 -5 torr. The structural, surface morphological and optical properties of deposited films were studied by using X-ray diffraction (XRD), Scanning Electron Microscopy (SEM) and UV-VIS Spectroscopy respectively. The XRD diffraction spectrum shows that the grown thin films are of polycrystalline in nature having hexagonal structure. The SEM reveals that films have smooth surface area. The optical constant of grown CdSe thin films were determined by UV-VIS spectroscopy and it is found about 3.3 to 3.7 eV.