Coupling a Sophisticated Growth System with Synchrotron-Based Spectroscopy of Magnetic Nanostructures

Epitaxial magnetic multilayers are grown in a new deposition system that can be coupled to a variety of synchrotron-based spectroscopic tools at the SRC, such as angle-resolved photoemission with a Scienta analyzer, spin-polarized photoemission, and resonant magnetic x-ray scattering. It is possible to deposit materials by sputter-deposition and by evaporation in the same system, thereby allowing a comparison between industrial fabrication methods and laboratory techniques. The atomic structure is characterized by RHEED (including differentially-pumped RHEED during sputter-deposition), LEED, and resonant X-ray scattering at the L-edges of Fe, Co, Ni, and Cu. Magnetic properties are determined by the Kerr effect, spin-polarized, angle-resolved photoemission, and diffuse magnetic X-ray scattering. Electronic states are investigated by highresolution photoemission with particular emphasis on the states near the Fermi level.