Panda-MVD-note 005 Setup of a test-station for double-sided silicon microstrip detectors

A test station for double-sided silicon strip detectors (DSSD) has been set up allowing a full functional characterization of both silicon sensors and connected readout electronics. Due to the modular concept an adaptation to different sensor and frontend types is possible in future applications. First sensor modules have been tested successfully using the APV25 frontend chip. The entire setup can be controlled and monitored with a standard commercial PC. Components for signal processing and data acquisition are either custom made or commercially available. In parallel to a complete online monitoring, data is stored for further offline analysis. First measurements with the implemented sensor modules demonstrate the full functionality of the test station. In addition to a complete characterization of frontend electronics and sensors, results concerning energy deposition of penetrating particles, charge distribution within the sensor and imaging position resolution were obtained. This article contains a summary of all main components used within the test station, an illustration of the experimental setup and a description of the implemented software and data acquisition. Finally, main results of the measurements are summarized. Thomas Würschig et al MVD-note 005 Figure 1: Schematics of the test station with all main components. A modular concept of independent building blocks has been implemented. High voltage (HV) supply [12] , ADC card [15] and the FPGA board (using a SPARTAN3-E) [13] delivering trigger and clock are commercially available modules. All other components have been developed specifically for the test station driven by specifications of the chosen frontend chip (APV25-S1) and the sensor used.