On-Line Detection and Correction of Errors Due to Fast , Dynamic Voltage Droop Events

Jim Tschanz,Keith Bowman,Shih-Lien Lu,Paolo Aseron,Muhammad Khellah,Arijit Raychowdhury,Bibiche Geuskens,Carlos Tokunaga,Chris Wilkerson,Tanay Karnik

semanticscholar（2010）

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摘要

—Built-in resiliency features enable a microprocessor core to detect and correct timing errors due to fast dynamic voltage droop events as well as other types of dynamic variations.

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