Residual stress and microstructure of ysz buffer layers for ybco coated conductor

Y2O3–ZrO2(YSZ) buffer layer was prepared by sol-gel technique. Residual stress and microstructure in the YSZ buffer layers were investigated as a function of temperature. Textured YSZ buffer layers were grown on biaxially textured-Ni (100) substrates using sol-gel method. YSZ coating on textured Ni substrate were annealed at 1150 °C under a flowing 4% H2–Ar gas. Residual stress of buffer layers was analytically calculated. The surface morphologies and microstructure of all samples were characterized by using ESEM.