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A Study of Single-Electron Tunneling Functionalities in Highly-Doped Silicon-on-Insulator Junctionless Transistors

2020 IEEE Silicon Nanoelectronics Workshop (SNW)(2020)

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Abstract
As an extension of the continuous miniaturization trend for Si transistors, single-electron effects related to dopants in the nanoscale transistor channels have been recently considered for low-power and fundamental applications. Research on dopant-based single-electron tunneling (SET) functionality extends from single-donor quantum dots (QDs) to multiple-donor QDs. Different from using complex techniques for doping, we show that a simpler, uniform doping technique at high-concentration of nanoscale silicon-on-insulator (SOI) transistors can offer the statistical conditions for the formation of isolated multiple-donor clusters that allow SET functionality, even at room temperature.
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Key words
single-electron,highly-doped,silicon-on-insulator
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