ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric
2020 IEEE 38th VLSI Test Symposium (VTS)（2020）
关键词
ATTEST,memory cell testing,interconnect network testing,systematic approach,multiplexer,full-adder,D flip-flop,multiphase cascadable scheme,FPGAs,novel transistor-level programmable fabric,TRAP logic elements,test coverage,TRAP programming bits,test patterns,programmable transistors,TRAP fabric,application-agnostic test methodology,transistor-level architecture,Field-Programmable Gate Arrays,test schemes,manufacturing defect detection,ASICs,Application-Specific Integrated Circuits,high-density reconfigurable logic
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