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A New Neutron Depth Profiling Spectrometer at the JCNS for a Focused Neutron Beam

E. Vezhlev,A. Ioffe,S. Mattauch,S. Staringer,V. Ossovyi, Ch. Felder,E. Hueger,J. Vacik,I. Tomandl,V. Hnatowicz,C. Chen,P. H. L. Notten, Th. Brueckel

Radiation effects and defects in solids（2020）

Cited 2|Views86
Key words
Neutron depth profiling,in situ,operando methods,near-surface analysis,thin-film lithium batteries
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