A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam

E. Vezhlev,A. Ioffe,S. Mattauch, S. Staringer, V. Ossovyi, Ch. Felder, E. Hüger,J. Vacik,I. Tomandl,V. Hnatowicz,C. Chen,P.H.L. Notten,Th. Brückel

RADIATION EFFECTS AND DEFECTS IN SOLIDS(2020)

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摘要
A new neutron depth profiling (NDP) spectrometer has been designed and built for the use at a high intensity focused cold neutron beam of the reflectometer MARIA at the Heinz Maier-Leibnitz Zentrum (MLZ, Germany). The extremely high neutron flux at the sample position of MARIA joined with the multiple charged particle detectors allows less than 10 s sampling rate and paves the way to study the kinetics of Li ions in thin-film microbatteries. The performance of the spectrometer with standard calibration samples and amorphous thin films is presented; possibilities to operando study the Li distribution inside thin-film rechargeable lithium batteries are discussed.
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关键词
Neutron depth profiling,in situ,operando methods,near-surface analysis,thin-film lithium batteries
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