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Vertical Sidewall MoS2 Growth and Transistors

2019 Device Research Conference (DRC)(2019)

Cited 2|Views40
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Abstract
We present novel growth of the two-dimensional (2D) semiconductor MoS 2 directly on oxide/Si sidewalls as deep as $3\ \mu \mathrm{m}$ , demonstrating the first vertical 2D transistors with $I_{\mathrm{o}\mathrm{n}}/I_{\mathrm{off}} > 10^{7}$ and $I_{\mathrm{o}\mathrm{n}}\approx 30\mu \mathrm{A}/\mu \mathrm{m}$ , showing promise for high-density memory selector applications. We also demonstrate direct growth on high-k AbO 3 , an important step towards realizing VLSI-compatible 2D transistors. Our results show that 2D semiconductors can be implemented on non-planar surfaces with amorphous dielectrics for 3D back-end-of-line (BEOL) integration and high-density vertical memory selectors.
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Key words
3D back-end-of-line integration,high-density memory selector applications,two-dimensional semiconductor growth,vertical sidewall growth,vertical sidewall transistors,vertical 2D transistors,high-k materials,VLSI-compatible 2D transistors,nonplanar surfaces,amorphous dielectrics,MoS2-Si,Al2O3
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