Novel Concept of the Transistor Variation Directed Toward the Circuit Implementation of Physical Unclonable Function (PUF) and True-random-number Generator (TRNG)
2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)（2019）
关键词
transistor variation,circuit implementation,PUF,physical unclonable function,true random number generator,RTN TRNG,RTN behavior,NIST test,IoT security application,hamming weigh,FinFET,temperature 150.0 degC,temperature 293.0 K to 298.0 K,word length 256.0 bit
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要