Resolution limits of a single crystal scintillator based X-ray micro-radiography camera

J. Tous, J. Parizek,K. Blazek, M. Sulc, R. Melich,M. Dusek, T. Vanek

JOURNAL OF INSTRUMENTATION(2020)

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摘要
Recently, high resolution micro-radiography became of great interest. Very thin scintillator layers of about 5-20 micrometres are used to achieve spatial resolution below one micrometre in application for low energy X-ray micro-radiography [1]. Such thin screens are mainly used in micro-XCT and nano-XCT systems (X-ray Computed Tomography) with either micro-focus X-ray tubes or with synchrotron sources [2]. This work deals with a high-resolution CCD camera together with different optical systems and different single crystal scintillators in application for low energy X-ray micro-radiography. The light distribution on the screen is re-imaged by an optical system (usually represented by classical microscope objective together with a field lens) to a high-resolution CCD or CMOS chip. A theoretical modelling and practical comparison of a camera set-up has been done to investigate the system resolution limits. Thin screens were prepared from YAG:Ce scintillator. The resolution is presented on test patterns. As recent optical systems are limited to the classical microscopy objectives only, we further investigate a possibility to develop a custom-made objective fully dedicated to X-ray imaging application.
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关键词
X-ray detectors,X-ray radiography and digital radiography (DR),Scintillators, scintillation and light emission processes (solid, gas and liquid scintillators)
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