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Stabilization of the perovskite phase in PMN-PT epitaxial thin films via increased interface roughness

Urška Gabor,Damjan Vengust,Zoran Samardžija,Aleksander Matavž,Vid Bobnar,Danilo Suvorov,Matjaž Spreitzer

Applied Surface Science（2020）

Cited 12|Views20
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Abstract
•Bottom electrode has a strong influence on the growth of the active layer.•LaNiO3 electrode strongly stabilizes the perovskite phase.•Stabilization is mainly related to increased interface roughness.•Increased interface roughness does not have adverse effects on the film properties.
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Key words
PLD,PMN-PT thin film,Pyrochlore,Bottom electrode,Sticking coefficient
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