Talbot-Lau Interferometry-Based X-Ray Imaging System With Retractable And Rotatable Gratings For Nondestructive Testing

We develop an x-ray imaging system based on Talbot-Lau interferometry equipped with a mechanical structure for retracting and rotating gratings from the optical axis, which enables not only x-ray phase contrast imaging but also conventional x-ray imaging with high-magnification such as microcomputed tomography (mu CT). We investigate the characterization of carbon fiber reinforced plastic (CFRP) laminates using this apparatus. Microcracks and fiber orientations are visualized in the dark-field images. Compared with the obtained mu CT images, the relationship between the CFRP microstructures and the contrasts in the dark-field images are recognizable.