3D Defect detection using weighted principal component thermography

Seppe Sels,Boris Bogaerts,Simon Verspeek,Bart Ribbens,Gunther Steenackers,Rudi Penne,Steve Vanlanduit

Optics and Lasers in Engineering（2020）

Cited 8|Views13

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Abstract

•A thermal camera setup is used to detect defects in materials.•A CAD matching procedure is used to map a 2D infrared image to a 3D cad file.•With the 3D alignment a quality metric of the measurement is calculated.•With this metric misclassifications are reduced.

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Key words

Thermography,3D,Matching,Active thermography,Pulsed thermography,Principal component analysis,Principal component thermography,3D Thermography,Infrared imaging

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