Exploiting Asymmetry in eDRAM Errors for Redundancy-Free Error-Tolerant Design

IEEE Transactions on Emerging Topics in Computing(2021)

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摘要
For some applications, errors have a different impact on data and memory systems depending on whether they change a zero to a one or the other way around; for an unsigned integer, a one to zero (or zero to one) error reduces (or increases) the value. For some memories, errors are also asymmetric; for example, in a DRAM, retention failures discharge the storage cell. The tolerance of such asymmetri...
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关键词
Random access memory,Computer architecture,Microprocessors,Error correction codes,Power demand,Capacitors,Discharges (electric)
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