Proton Characterization Of Rtg4 Flash-Based Fpga For Leo Environment

2019 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW)(2019)

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Abstract
The single-event response of the RTG4 flash-based FPGA is characterized using 64 and 200 MeV proton sources. Several blocks are tested, including self-corrected triple module redundant (STMR) flip-flops with SET filter enabled and disabled, micro SRAM (mu SRAM), large SRAM (LSRAM), phase locked loop (PLL), serializer/deserializer (SERDES) and fabric double data rate controller (FDDRC). In-beam power on reset (POR) and reprogramming/verify are evaluated for the first time in proton environment.
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flash-based
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