Micro-ion beam-induced luminescence spectroscopy for evaluating SiAlON scintillators

Ion beam-induced luminescence (IBIL) spectroscopy was used for luminescent material characterization and analysis for the investigation of new scintillator families. Under continuous 3 MeV proton microbeam irradiation, the crystal structures of α-SiAlON:Eu, β-SiAlON:Eu, and CaAlSiN3 (CASN) emitted bright luminescence at peak wavelengths of 605, 540, and 670 nm, respectively. As the irradiation progressed, the IBIL intensity of the conventional ZnS:Ag scintillator decreased sharply, whereas that of the SiAlONs and CASN remained within the detection limit. IBIL spectroscopy was performed on individual grains of the SiAlON scintillators. IBIL imaging and spectroscopy of two grains of β-SiAlON:Eu showed that the main peak in the IBIL spectrum of β-SiAlON:Eu obtained from a large-area beam scan consisted of several small peaks, which were observed in spectra from individual grains. Our experimental results suggest that microscopic spectroscopy of IBIL is an effective tool for microscopic material characterization of luminescent targets.