Characterization and Analysis of On-Chip Microwave Passive Components at Cryogenic Temperatures
IEEE Journal of the Electron Devices Society(2020)
摘要
This paper presents the characterization and modeling of microwave passive components in TSMC 40-nm bulk CMOS, including metal-oxide-metal (MoM) capacitors, transformers, and resonators, at deep cryogenic temperatures (4.2 K). To extract the parameters of the passive components, the pad parasitics were de-embedded from the test structures using an open fixture. The variations in capacitance, induc...
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关键词
Cryogenics,Capacitors,Metals,Probes,Q-factor,Temperature
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